X-RAY DIFFRACTION ANALYSIS OF ZnO, CuO, ANd Cu₂O THIN FILMS DEPOSITED BY ION-PLASMA TECHNOLOGY. Global Conference on Multidisciplinary Research and Innovation, [S. l.], v. 1, n. 5, p. 293–304, 2026. Disponível em: https://econferencia.com/index.php/1/article/view/777. Acesso em: 10 jun. 2026.